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ISO 20263:2017現(xiàn)行
Microbeam analysis - Analytical electron microscopy - Method for the determination of interface position in the cross-sectional image of the layered materials
出版：International Organization for Standardization
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基本信息
標(biāo)準(zhǔn)編號： ISO 20263:2017
發(fā)布時間：2017/12/1 0:00:00
標(biāo)準(zhǔn)類別：Standard
出版單位：International Organization for Standardization
標(biāo)準(zhǔn)頁數(shù)：45
標(biāo)準(zhǔn)簡介
Describes a procedure for the determination of averaged interface position between two different layered materials recorded in the cross-sectional image of the multi-layered materials
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