
Essential Ratings And Characteristics Of Semiconductor Devices And General Principles Of Measuring Methods - Reference Methods Of Measurement
出版:International Electrotechnical Committee

專家解讀視頻
147-3A FIRST SUPPLEMENT 1973Deals with the guiding principles in selecting reference methods and thermal conditions of electrical reference measurements, and transistors.
NFC 96 112:1981 - Similar
NFC 96 113:1980 - Similar
DIN 41793-2 (1974-03) - Similar