IEC/PAS 62186 Ed. 1.0被替代
Mechanical shock test method
出版：International Electrotechnical Committee
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基本信息
標準編號： IEC/PAS 62186 Ed. 1.0
發布時間：2000/8/1 0:00:00
標準類別：Standard
出版單位：International Electrotechnical Committee
標準頁數：3
標準簡介
Determines the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. This is a destructive test intended for device qualification. It is normally applicable to cavity-type packages.
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