EIA JESD 22-A103:2010被替代
High Temperature Storage Life
出版：JEDEC Solid State Technology Association
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基本信息
標準編號： EIA JESD 22-A103:2010
發布時間：2010/12/1 0:00:00
標準類別：Standard
出版單位：JEDEC Solid State Technology Association
標準頁數：10
標準簡介
Applies for evaluation, screening, monitoring, and/or qualification of all solid state devices. High Temperature storage test is typically used to determine the effect of time and temperature, understorage conditions, for thermally activated failure mechanisms of solid state electronic devices, including nonvolatile memory devices (data retention failure mechanisms).
標準備注
Supersedes EIA JESD 22 (07/2004)
本標準替代的舊標準
替代本標準的新標準
