
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 47/2468/CDV:2018); German and English version prEN 60749-18:2018
出版:German Institute for Standardisation (Deutsches Institut für Normung)

專家解讀視頻
基本信息
標準編號: DIN EN 60749-18 : 2018
標準類別:Draft
出版單位:German Institute for Standardisation (Deutsches Institut für Normung)
標準頁數:0
標準簡介
This part of IEC 60749 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source.
本標準替代的舊標準