ISO/DIS 15632 (2002)被替代
Microbeam Analysis - Instrumental Specification For Energy Dispersive X-ray Spectrometers With Semiconductor Diode Detectors
出版：International Organization for Standardization
專家解讀視頻
基本信息
標準編號： ISO/DIS 15632 (2002)
標準類別：Draft
出版單位：International Organization for Standardization
標準頁數：0
標準簡介
Provides the most important quantities that characterise a X-ray semiconducting diode detector in connection with the signal-processing unit of an energy dispersive X-ray (EDS) spectrometer and gives minimum requirements for such spectrometers attached to an electron probe microanalyser (EPMA) or a scanning electron microscope (SEM).
替代本標準的新標準
