當(dāng)前位置：
首頁 >
標(biāo)準(zhǔn)詳情頁
ISO/DIS 19214 : 60.00 (2017)被替代
MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - METHOD OF DETERMINATION FOR APPARENT GROWTH DIRECTION OF WIRELIKE CRYSTALS BY TRANSMISSION ELECTRON MICROSCOPY
出版：International Organization for Standardization
專家解讀視頻
基本信息
標(biāo)準(zhǔn)編號(hào)： ISO/DIS 19214 : 60.00 (2017)
標(biāo)準(zhǔn)類別：Standard
出版單位：International Organization for Standardization
標(biāo)準(zhǔn)頁數(shù)：0
標(biāo)準(zhǔn)簡介
Pertains to determine the apparent growth direction of all kinds of wirelike crystalline materials fabricated by variant methods.
替代本標(biāo)準(zhǔn)的新標(biāo)準(zhǔn)
