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IEC 60931-2 Ed. 2.0現(xiàn)行

Shunt power capacitors of the non-self-healing type for a.c. systems having a rated voltage up to and including 1000 V Part 2: Ageing test and destruction test

出版：International Electrotechnical Committee

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基本信息

標(biāo)準(zhǔn)編號： IEC 60931-2 Ed. 2.0

發(fā)布時間：1995/12/13 0:00:00

標(biāo)準(zhǔn)類別：Standard

出版單位：International Electrotechnical Committee

標(biāo)準(zhǔn)頁數(shù)：17

標(biāo)準(zhǔn)簡介

Applies to capacitors according to IEC 60931-1 and gives the requirements for the ageing test and destruction test for these capacitors. The two ageing test methods are intended to ensure that the capacitor case temperature is maintained constant during the test. The destruction test is performed to evaluate the behaviour of the capacitor at the end of its life.

本標(biāo)準(zhǔn)替代的舊標(biāo)準(zhǔn)

IEC 60070 Ed. 2.0

IEC 60070A

等同采用的國際標(biāo)準(zhǔn)

ONORM OVE EN 60931-2:1996 - Identical

NEN 10931-2:1996 - Identical

SN EN 60931-2:1996 - Identical

CEI EN 60931-2 Ed. 2 (1997) - Identical

DIN EN 60931-2 (1997-08) - Identical

VDE 0560-49:1997 - Identical

GB/T 17886.2-1999 - Identical

BS EN 60931-2:1996 - Equivalent