NEN ISO 17470:2004被替代
Microbeam Analysis - Electron Probe Microanalysis - Guidelines For Qualitative Point Analysis By Wavelength Dispersive X-ray Spectrometry
出版：Nederlands Normalisatie Instituut
專家解讀視頻
基本信息
標準編號： NEN ISO 17470:2004
發布時間：2004/9/1 0:00:00
標準類別：Standard
出版單位：Nederlands Normalisatie Instituut
標準頁數：10
標準簡介
Provides guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.
等同采用的國際標準
ISO 17470:2004 - Identical
