
HIGH TEMPERATURE STORAGE LIFE
出版:International Electrotechnical Committee

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基本信息
標準編號: IEC PAS 62205 : 1.0
發布時間:2000/11/28 0:00:00
標準類別:Standard
出版單位:International Electrotechnical Committee
標準頁數:10
標準簡介
Aims to determine the effect on solid state electronic devices of storage at elevated temperature without electrical stress applied. This test is considered destructive and therefore, is applicable for device qualification.
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