EIA JESD 22-A117:2006被替代
Electrically Erasable Programmable Rom (eeprom) Program/erase Endurance And Data Retention Test
出版：JEDEC Solid State Technology Association
專家解讀視頻
基本信息
標準編號： EIA JESD 22-A117:2006
發布時間：2006/3/1 0:00:00
標準類別：Standard
出版單位：JEDEC Solid State Technology Association
標準頁數：76
標準簡介
Establishes a standard procedure for determining the data cycling endurance and data retention capability of non-volatile memory cells. It is intended as a qualification and monitor test procedure. This test is also applicable to FLASH EEPROM integrated circuits and Erasable Programmable Logic Devices (EPLD) with embedded EEPROM or FLASH memory.
標準備注
Supersedes EIA JESD 22 (07/2004)
本標準替代的舊標準
替代本標準的新標準
