EN 60749-27 : 2006 AMD 1 2012現行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - MACHINE MODEL (MM) (IEC 60749-27:2006/A1:2012)
出版：European Committee for Standards - Electrical
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基本信息
標準編號： EN 60749-27 : 2006 AMD 1 2012
標準類別：Standard
出版單位：European Committee for Standards - Electrical
標準頁數：0
標準簡介
Describes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD).
