NEN EN IEC 60749-31:2003現行
Semiconductor Devices - Mechanical And Climatic Test Methods - Part 31: Flammability Of Plastic-encapsulated Devices (internally Induced)
出版：Nederlands Normalisatie Instituut
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基本信息
標準編號： NEN EN IEC 60749-31:2003
發布時間：2003/8/1 0:00:00
標準類別：Standard
出版單位：Nederlands Normalisatie Instituut
標準頁數：9
標準簡介
Applies to semiconductor devices (discrete devices and integrated circuits). It's test objective is to determine the device ignites due to internal heating caused by excessive overloads.
