UNI EN 15991:2011被替代
Testing Of Ceramic And Basic Materials - Direct Determination Of Mass Fractions Of Impurities In Powders And Granules Of Silicon Carbide By Inductively Coupled Plasma Optical Emission Spectrometry (Icp Oes) With Electrothermal Vaporisation (Etv)
出版：Italian Standards
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基本信息
標準編號： UNI EN 15991:2011
標準類別：Standard
出版單位：Italian Standards
標準頁數：0
標準簡介
Explains a method for the determination of the trace element concentrations of Al, Ca, Cr, Cu, Fe, Mg, Ni, Ti, V and Zr in powdered and granular silicon carbide.
替代本標準的新標準
等同采用的國際標準
EN 15991:2015 - Identical
