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IEC 61124 Ed. 2.0被替代

Reliability testing - Compliance tests for constant failure rate and constant failure intensity

出版：International Electrotechnical Committee

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基本信息

標(biāo)準編號： IEC 61124 Ed. 2.0

發(fā)布時間：2006/3/15 0:00:00

標(biāo)準類別：Standard

出版單位：International Electrotechnical Committee

標(biāo)準頁數(shù)：249

標(biāo)準簡介

This International Standard gives a number of optimized test plans, the corresponding operating characteristic curves and expected test times. In addition the algorithms for designing test plans using a spreadsheet program are also given, together with guidance on how to choose test plans. This standard does not cover guidance on how to plan, perform, analyse and report a test. This information can be found in IEC 60300-3-5. This standard does not describe test conditions. This information can be found in IEC 60605-2 and in IEC 60605, Parts 3-1 to 3-6.

本標(biāo)準替代的舊標(biāo)準

IEC 61124 Ed. 1.0

IEC 605-7 Ed. 1.0

替代本標(biāo)準的新標(biāo)準

IEC 61124 Ed. 3.0

等同采用的國際標(biāo)準

UNE EN 61124:2008 - Identical

OVE/ONORM EN 61124:2007 - Identical

PN EN 61124:2006 - Identical

NEN EN IEC 61124:2006 - Identical

SS EN 61124 Ed. 1 (2006) - Identical

NF EN 61124:2006 - Identical