當前位置： 首頁 > 標準詳情頁

ISO 3497:2000現行

Metallic coatings - Measurement of coating thickness - X-ray spectrometric methods

出版：International Organization for Standardization

獲取原文如何獲取原文？問客服獲取原文，即可享受本標準狀態變更提醒服務！

專家解讀視頻

基本信息

標準編號： ISO 3497:2000

發布時間：2000/12/21 0:00:00

標準類別：Standard

出版單位：International Organization for Standardization

標準頁數：18

標準簡介

WARNING Problems concerning protection of personnel against X-rays are not covered by this International Standard. For information on this important aspect, reference should be made to current international and national standards, and to local regulations, where these exist.This International Standard specifies methods for measuring the thickness of metallic coatings by the use of X-ray spectrometric methods.The measuring methods to which this International Standard applies are fundamentally those that determine the mass per unit area. Using a knowledge of the density of the coating material, the results of measurements can also be expressed as linear thickness of the coating.The measuring methods permit simultaneous measurement of coating systems with up to three layers, or simultaneous measurement of thickness and compositions of layers with up to three components.The practical measurement ranges of given coating materials are largely determined by the energy of the characteristic X-ray fluorescence to be analysed and by the acceptable measurement uncertainty and can differ depending upon the instrument system and operating procedure used.

本標準替代的舊標準

ISO 3497:1990

等同采用的國際標準

SS ISO 3497 Ed. 1 (1991) - Identical

SS EN ISO 3497 Ed. 1 (2001) - Identical

UNE 112026:1992 - Identical

PN EN ISO 3497:2004 - Identical

NEN EN ISO 3497:2001 - Identical

NFA 91 116:1976 - Equivalent

NS EN ISO 3497 Ed. 1 (2001) - Identical

DIN 50987 (1987-07) - Identical

BS 5411-8:1991 - Identical