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EIA JESD 22-A101:1997被替代
Steady State Temperature Humidity Bias Life Test
出版：JEDEC Solid State Technology Association
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基本信息
標(biāo)準(zhǔn)編號： EIA JESD 22-A101:1997
發(fā)布時(shí)間：1997/4/1 0:00:00
標(biāo)準(zhǔn)類別：Standard
出版單位：JEDEC Solid State Technology Association
標(biāo)準(zhǔn)頁數(shù)：0
標(biāo)準(zhǔn)簡介
Evaluates the reliability of non-hermetic packaged solid-state devices in humid environments. It employs conditions of temperature, humidity, and bias which accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors which pass through it.
標(biāo)準(zhǔn)備注
Supersedes EIA JESD 22 (07/2004)
本標(biāo)準(zhǔn)替代的舊標(biāo)準(zhǔn)
替代本標(biāo)準(zhǔn)的新標(biāo)準(zhǔn)
