
Semiconductor Devices - Micro-electromechanical Devices Part 17: Bulge Test Method for Measuring Mechanical Properties of Thin Films
出版:National Standards Authority of Ireland

專家解讀視頻
基本信息
標準編號: I.S. EN 62047-17:2015
發布時間:2015/7/28 0:00:00
標準類別:Standard
出版單位:National Standards Authority of Ireland
標準頁數:66
標準簡介
Defines the method for performing bulge tests on the free-standing film that is bulged within a window.
等同采用的國際標準
EN 62047-17:2015 - Identical