CEI EN IEC 60749-18 : 2019現行
Semiconductor devices - Mechanical and climatic test methods Part 18: Ionizing radiation (total dose) Sommario
出版：Comitato Elettrotecnico Italiano
專家解讀視頻
基本信息
標準編號： CEI EN IEC 60749-18 : 2019
發布時間：2019/10/1 0:00:00
標準類別：Test Method
出版單位：Comitato Elettrotecnico Italiano
標準頁數：0
標準簡介
This part of IEC 60749 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source.
本標準替代的舊標準
等同采用的國際標準
EN IEC 60749-18 : 2019 - Identical
IEC 60749-18:2019 - Identical
IEC 60749-18:2019 - Identical
