EIA JEP 172:2014被替代
Discontinuing Use Of The Machine Model For Device Esd Qualification
出版：Joint Electronics Device Engineering Council (JEDEC)
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基本信息
標準編號： EIA JEP 172:2014
發布時間：2014/7/1 0:00:00
標準類別：Standard
出版單位：Joint Electronics Device Engineering Council (JEDEC)
標準頁數：20
標準簡介
Demonstrates evidence to discontinue use of "machine model" particular model stress test without incurring any reduction in the IC component's ESD reliability for manufacturing. Aims to provide the necessary technical arguments for strongly recommending no further use of this model for IC qualification.
替代本標準的新標準
