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ISO/DIS 22489被替代
Microbeam Analysis - Electron Probe Microanalysis - Quantitative Point Analysis For Bulk Specimen Using Wavelength Dispersive X-ray Spectroscopy
出版：International Organization for Standardization
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基本信息
標(biāo)準(zhǔn)編號： ISO/DIS 22489
標(biāo)準(zhǔn)類別：Draft
出版單位：International Organization for Standardization
標(biāo)準(zhǔn)頁數(shù)：0
標(biāo)準(zhǔn)簡介
Specifies requirements for the quantification of elements in a micrometre-sized volume of a specimen identified through analysis of the X-rays generated by an electron beam using wavelength-dispersive spectrometers fitted either to an electron probe microanalyser or to a scanning electron microscope.
替代本標(biāo)準(zhǔn)的新標(biāo)準(zhǔn)
