IEC/PAS 62175 Ed. 1.0被替代
Marking permanency test method
出版：International Electrotechnical Committee
專家解讀視頻
基本信息
標準編號： IEC/PAS 62175 Ed. 1.0
發布時間：2000/8/1 0:00:00
標準類別：Standard
出版單位：International Electrotechnical Committee
標準頁數：5
標準簡介
Verifies that the markings on solid state semiconductor devices will not become illegible when subjected to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process.
替代本標準的新標準
