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CEI EN 61326-2-1 : 2013現(xiàn)行
ELECTRICAL EQUIPMENT FOR MEASUREMENT, CONTROL AND LABORATORY USE - EMC REQUIREMENTS - PART 2-1: PARTICULAR REQUIREMENTS - TEST CONFIGURATIONS, OPERATIONAL CONDITIONS AND PERFORMANCE CRITERIA FOR SENSITIVE TEST AND MEASUREMENT EQUIPMENT FOR EMC UNPROTECTED
出版：Comitato Elettrotecnico Italiano
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基本信息
標(biāo)準(zhǔn)編號(hào)： CEI EN 61326-2-1 : 2013
發(fā)布時(shí)間：2013/1/1 0:00:00
標(biāo)準(zhǔn)類別：Standard
出版單位：Comitato Elettrotecnico Italiano
標(biāo)準(zhǔn)頁(yè)數(shù)：16
標(biāo)準(zhǔn)簡(jiǎn)介
Describes more detailed test configurations, operational conditions and performance criteria for equipment with test and measurement circuits that are not EMC protected for operational and/or functional reasons, as specified by the manufacturer.
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EN 61326-2-1 : 2013 - Identical
