IEC 60749-32 Ed. 1.1現(xiàn)行
Semiconductor devices - Mechanical and climatic test methods Part 32: Flammability of plastic-encapsulated devices (externally induced)
出版：International Electrotechnical Committee
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基本信息
標準編號： IEC 60749-32 Ed. 1.1
發(fā)布時間：2010/11/29 0:00:00
標準類別：Standard
出版單位：International Electrotechnical Committee
標準頁數(shù)：9
標準簡介
IEC 60749-32:2002+A1:2010 is applicable to semiconductor devices (discrete devices and integrated circuits). The object of this test is to determine whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device. This consolidated version consists of the first edition (2002) and its amendment 1 (2010). Therefore, no need to order amendment in addition to this publication.
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