CEI EN 60749-9 : 2004現行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 9: PERMANENCE OF MARKING
出版：Comitato Elettrotecnico Italiano
專家解讀視頻
基本信息
標準編號： CEI EN 60749-9 : 2004
發布時間：2004/1/1 0:00:00
標準類別：Standard
出版單位：Comitato Elettrotecnico Italiano
標準頁數：12
標準簡介
Describes the marks on solid state semiconductor devices will remain legible when subjected to the application and removal of labels or the use of solvents and cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board manufacturing process.
本標準替代的舊標準
等同采用的國際標準
EN 60749-9 : 2017 - Identical
IEC 60749-9 ED 2 : 2017 - Identical
IEC 60749-9 ED 2 : 2017 - Identical
