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ASTM F1467-99(2005)被替代

Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

出版：American Society for Testing and Materials

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基本信息
標(biāo)準(zhǔn)編號(hào)： ASTM F1467-99(2005)
發(fā)布時(shí)間：2005/1/1 0:00:00
標(biāo)準(zhǔn)類別：Standard
出版單位：American Society for Testing and Materials
標(biāo)準(zhǔn)頁(yè)數(shù)：18
標(biāo)準(zhǔn)簡(jiǎn)介

CONTAINED IN VOL. 10.04, 2006Covers recommended procedures for the use of X-ray testers (that is, sources with a photon spectrum having approximately equal to 10 ke V mean photon energy and approximately equal to 50 ke V maximum energy) in testing semiconductor discrete devices and integrated circuits for effects from ionizing radiation.

本標(biāo)準(zhǔn)替代的舊標(biāo)準(zhǔn)

ASTM F1467-99

替代本標(biāo)準(zhǔn)的新標(biāo)準(zhǔn)

ASTM F1467-99(2005)e1