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BS 6493-3(1985) : 1985已作廢
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS
出版：British Standards Institution
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基本信息
標(biāo)準(zhǔn)編號(hào)： BS 6493-3(1985) : 1985
發(fā)布時(shí)間：1985/1/1 0:00:00
標(biāo)準(zhǔn)類(lèi)別：Standard
出版單位：British Standards Institution
標(biāo)準(zhǔn)頁(yè)數(shù)：42
標(biāo)準(zhǔn)簡(jiǎn)介
Gives selection test methods applicable to semiconductor devices (discrete devices and integrated circuits). Additional test methods may be required for non-cavity devices. Provides uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices. Includes mechanical, climatic and miscellaneous test methods.
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