IEC/TR 61641 Ed. 1.0被替代

Enclosed low-voltage switchgear and controlgear assemblies - Guide for testing under conditions of arcing due to an internal fault

出版：International Electrotechnical Committee

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基本信息

標(biāo)準(zhǔn)編號(hào)： IEC/TR 61641 Ed. 1.0

發(fā)布時(shí)間：1996/1/30 0:00:00

標(biāo)準(zhǔn)類別：TechnicalReport

出版單位：International Electrotechnical Committee

標(biāo)準(zhǔn)頁數(shù)：18

標(biāo)準(zhǔn)簡(jiǎn)介

This technical report makes allowance for internal overpressure acting on covers, doors, etc. and also takes into consideration the thermal effects of the arc or its roots on the enclosures and of ejected hot gases and glowing particles, but not damage to internal partitions.

替代本標(biāo)準(zhǔn)的新標(biāo)準(zhǔn)

IEC/TR 61641 Ed. 2.0

等同采用的國(guó)際標(biāo)準(zhǔn)

UNE 201001:2000 - Identical

CEI 17-86 Ed. 1 (2004) - Identical

NEN NPR 11641:1996 - Identical

DIN EN 60439-1 SUPP 2 (1997-10) - Identical

GB/Z 18859-2002 - Identical

VDE 0660-500 SUPP 2:1997 - Identical

PN E-05163:2002 - Identical

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IEC/TR 61641 Ed. 1.0被替代

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