
Visual And Mechanical Inspection Multilayer Ceramic Chip Capacitors
出版:Joint Electronics Device Engineering Council (JEDEC)

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基本信息
標準編號: EIA 595:1993
發布時間:1993/12/7 0:00:00
標準類別:Standard
出版單位:Joint Electronics Device Engineering Council (JEDEC)
標準頁數:0
標準簡介
This document covers the general industry inspection requirements for multilayer ceramic chip capacitors. The devices selected for inspection may be examined under 10 to 20 power magnification to determine compliance with the requirements specified. Sampling plans or lot accept reject criteria shall be negotiated between the manufacturer and the user buyer.
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