NEN EN IEC 60749-18 : 2019現行
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
出版：Netherlands Standards
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基本信息
標準編號： NEN EN IEC 60749-18 : 2019
標準類別：Standard
出版單位：Netherlands Standards
標準頁數：0
標準簡介
This part of IEC 60749 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source.
本標準替代的舊標準
