MDR 22 : LATEST已作廢
MICROCIRCUIT SCREENING ANALYSIS
出版：The Reliability Information Analysis Center
專家解讀視頻
基本信息
標準編號： MDR 22 : LATEST
標準類別：Standard
出版單位：The Reliability Information Analysis Center
標準頁數：0
標準簡介
Contains screen fallout rates for integrated circuits which provide a valuable baseline for defining expected fallout values for various device types and stress screen variables. Digital, linear, interface and memory devices are covered in this document.
