CEI EN 60749-28 : 1ED 2017現行
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 28: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - CHARGED DEVICE MODEL (CDM) - DEVICE LEVEL
出版：Comitato Elettrotecnico Italiano
專家解讀視頻
基本信息
標準編號： CEI EN 60749-28 : 1ED 2017
標準類別：Standard
出版單位：Comitato Elettrotecnico Italiano
標準頁數：0
標準簡介
Sets up the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD).
