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ISO 19668:2017現(xiàn)行
Surface chemical analysis - X-ray photoelectron spectroscopy - Estimating and reporting detection limits for elements in homogeneous materials
出版：International Organization for Standardization
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基本信息
標(biāo)準(zhǔn)編號： ISO 19668:2017
發(fā)布時間：2017/8/14 0:00:00
標(biāo)準(zhǔn)類別：Standard
出版單位：International Organization for Standardization
標(biāo)準(zhǔn)頁數(shù)：24
標(biāo)準(zhǔn)簡介
Defines a procedure by which elemental detection limits in X-ray photoelectron spectroscopy (XPS) can be estimated from data for a particular sample in common analytical situations and reported.
